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Volume 18 Issue 3
Sep.  2013
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Measurement of laser damaging thresholds of CCD devices

  • 1.

    Department of Applied Physics, Nanjing University of Science&Technology

  • Received Date: 1993-08-04
  • This paper analyzes the interaction process of laser beam and MOS CCD devices,and investigates the damage thresholds of CCD devices.In the experimental study,using a Q-switched YAG laser to irradiate a CCD device,the heat melting threshold,optical breaking threshold and direct damaging threshold of CCD are mea-sured,and the laser energy threshold causing whole CCD device failure is measured too.
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  • [1]

    Klein N.Thin Solid Films.1983,100,35
    [2] 陈斗南.物理学报,1987,36;838
    [3] 倪晓武,陆建,贺安之et al.Opt Commun,1989,74(3~4):185
    [4] 贺安之,倪晓武,陆建et al.Opt Commun.1992,91(1~2);62
    [5] 张向宇.实用化学手册,北京:国防工业出版社,1987,cha.1
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Measurement of laser damaging thresholds of CCD devices

  • 1. Department of Applied Physics, Nanjing University of Science&Technology
  • Received Date: 1993-08-04
  • Available Online: 1994-05-25

Abstract: This paper analyzes the interaction process of laser beam and MOS CCD devices,and investigates the damage thresholds of CCD devices.In the experimental study,using a Q-switched YAG laser to irradiate a CCD device,the heat melting threshold,optical breaking threshold and direct damaging threshold of CCD are mea-sured,and the laser energy threshold causing whole CCD device failure is measured too.

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