Measurement of laser damaging thresholds of CCD devices

Xiao-wu, Lu Jian, He An-zhi. Measurement of laser damaging thresholds of CCD devices[J]. LASER TECHNOLOGY, 1994, 18(3): 153-156.

Citation:

Xiao-wu, Lu Jian, He An-zhi. Measurement of laser damaging thresholds of CCD devices[J]. LASER TECHNOLOGY, 1994, 18(3): 153-156.

Citation:

Xiao-wu, Lu Jian, He An-zhi. Measurement of laser damaging thresholds of CCD devices[J]. LASER TECHNOLOGY, 1994, 18(3): 153-156.

Abstract

This paper analyzes the interaction process of laser beam and MOS CCD devices,and investigates the damage thresholds of CCD devices.In the experimental study,using a Q-switched YAG laser to irradiate a CCD device,the heat melting threshold,optical breaking threshold and direct damaging threshold of CCD are mea-sured,and the laser energy threshold causing whole CCD device failure is measured too.