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HAO Jian, ZHANG Ji-long, CUI Dan-feng, JING Ning. Spectrum recovery of Fourier transform spectrometer based on FPGA[J]. LASER TECHNOLOGY, 2011, 35(6): 804-807. DOI: 10.3969/j.issn.1001-3806.2011.06.022
Citation: HAO Jian, ZHANG Ji-long, CUI Dan-feng, JING Ning. Spectrum recovery of Fourier transform spectrometer based on FPGA[J]. LASER TECHNOLOGY, 2011, 35(6): 804-807. DOI: 10.3969/j.issn.1001-3806.2011.06.022
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Spectrum recovery of Fourier transform spectrometer based on FPGA

  • 1.

    Engineering Technology Research Center of Shanxi Province for Opto-Electronic Information and Instrument, North University of China, Taiyuan 030051, China;

  • 2.

    Key Laboratory of Instrumentation Science & Dynamic Measurement of Ministry of Education, North University of China, Taiyuan 030051, China

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  • Received Date: January 18, 2011
  • Revised Date: March 07, 2011
  • Published Date: November 24, 2011
    Graphical Abstract
    • Abstract
  • In order to obtain the real-time spectrum distribution information of such as chemical warfare, atmospheric pollutants by Fourier transform spectrometer, a data processing system, which can realize the single sideband interference fringes collection and spectrum recovery, was designed based on field pragrammable gate array(FPGA). In the system, apodization, fast Fourier transform(FFT), and phase correction was integrated in a FPGA chip with the advantages of high integration, high speed and low cost. The XC2VP30 chip of Xilinx's corporation was used to design the data processing module hardware circuit. Then the data collected by WQF-520 Fourier transform infrared spectrometer was transferred to FPGA for processing. Comparing the FPGA results with Matlab simulation results, the difference is within 1.2%. The results show that the system can recover spectrum correctly and is suitable for the interferometric spectrometer system of time modulation and space modulation.
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    • References (10)
  • [1]
    MANZARDO O,HERZIG H P,CULDIMANN B,et al.New design for an integrated fourier transform spectrometer[J].Proceedings of SPIE,2000,4178:310-319.
    [2]
    OSIPOV S I,LAPCHUK V P.Laboratory model of static Fourier spectrometer[J].Proceedings of SPIE,1997,3237:158-161.
    [3]
    YU K,LEE D,KRISHNAMOORTHY U,et al.Micromachined Fourier transform spectrometer on silicon optical bench platform[J].Sensors and Actuators,2006,130/131:523-530.
    [4]
    LIU Y,ZHAO Y Ch,GENG X R,et al.Analysis of the phase error non-linearity of FTS and discussion about mertz method[J].Spectroscopy and Spectral Analysis,2009,29(7):1809-1812(in Chinese).
    [5]
    HUANG M,XIANG L B,LU Q B,et al.Research on spatially modulated fourier transform imaging spectrometer data processing method[J].Spectroscopy and Spectral Analysis,2010,30(3):855-858(in Chinese).
    [6]
    ZHANG Y,ZHAO Y,WU X M,et al.Advancement on multi-spectrum detecting and laser multi-spectrum detecting technology[J].Laser Technology,2007,31(2):188-191( in Chinese).
    [7]
    TIAN E M,ZHANG J L,LI X,et al.Study on miniature static fourier transform spectrometer used in laser warning receiver[J].Spectroscopy and Spectral Analysis,2009,29(3):853-857(in Chinese).
    [8]
    XIANG L B,YUAN Y.Some aspects of the data processing of the single sided interferogram[J].Acta Photonica Sinica,2006,35(12):1869-1873(in Chinese).
    [9]
    LI B Sh,LIU Y,WANG A.Phase error correction by multiplicative method in optical fiber Fourier transform spectrometer[J].Chinese Journal of Quantum Electronics,2007,24(3):300-305(in Chinese).
    [10]
    ZHANG W J,ZHANG B,ZHANG X,et al.Effects of apodization functions of imaging fourier transform spectrometer on reconstructed spectrum[J].Journal of Infrared and Millimeter Waves,2008,27(3):227-232(in Chinese).
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