[1]
|
THORNTON J A,HOFFMAN D W.Stress-related effects in thin films.Thin Solid Films,1989,171(1):5-31. |
[2]
|
REICHER D W, McCORMACK S A.Production of thin film optical coatings with predetermined stress levels.Proceedings of the SPIE,2000,4091:104-110. |
[3]
|
GHANG Y H, JIN Ch Sh, LI Ch, et al. ArF excimer laser induced damage on high reflective fluoride film. Laser Technology,2014, 38(3):302-306 (in Chinese). |
[4]
|
FAN W X, WANG P Q, HAN J H, et al. Accumulation effect of film damage under repetitive laser pulses. Laser Technology,2014, 38(2):210-213 (in Chinese). |
[5]
|
D'HEURLE F M, HARPER J M E.Note on the origin of intrinsic stress in films deposited via evaporation and sputtering.Thin Solid Films,1989,171(1):81-92. |
[6]
|
POND B J, de BAR J I, CARNIGLIA C K, et al. Stress reduction in ion beam sputtered mixed oxide films. Applied Optics,1989,28(14):2800-2805. |
[7]
|
WINDISCHMANN H.Intrinsic stress in sputtered thin films.Journal of Vacuum Science,1991,A9(4):2431-2436. |
[8]
|
SHAO Sh Y.Study of the origin mechanism and controlling method of stress in thin films.Shanghai: Shanghai Institute of Optics and Fine Mechanics,2002:18-20 (in Chinese). |
[9]
|
MARTIN P J,NETTERFILED R P,SAINTY W G.Modification of the optical and structural properties of dielectric ZrO2 films by ion-assisted deposition.Journal of Applied Physics,1984,55(1):235-241. |
[10]
|
QIN Y W. Film thickness measurement based on optical coherence tomography. Laser Technology, 2012, 36(5): 662-664(in Chinese). |
[11]
|
TOKAS R B, SAHOO N K, THAKUR S,et al. A comparative morphological study of electron beam co-deposited binary optical thin films of HfO2:SiO2 and ZrO2:SiO2. Current Applied Physics,2007,8(5):589-602. |
[12]
|
REN H, ZENG Q, PANG Zh H, et al. Characteristics of Nd:Y3Al5O12 thin film prepared by electron beam evaporation deposition.Laser Technology,2012, 36(4): 450-452(in Chinese). |
[13]
|
SCHELL-SOROKIN A J, TROMP R M. Mechanical stresses in (sub) monolayer epitaxial films.Physical Review Letters,1990,64(9):1039-1042. |
[14]
|
WOLTERSDORF J,PIPPEL E.Substrate deformation and thin film growth.Thin Solid Films,1984,116(1/3):77-94. |
[15]
|
YU L F, YE Y T, WU J P. Defect detection and control of a laser conditioning system for large diameter optical film. Laser Technology,2012,36(2):188-190 (in Chinese). |