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Volume 35 Issue 3
May  2013
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Research of scattering characteristics of rough dielectric surfaces

  • In order to study the generation mechanism of scattering characteristics of dielectric random surfaces, on the basis of Kirchhoff approximation, light intensity scattered from rough dielectric surfaces was calculated by means of Monte-Carlo method. The geometric profile of rough surfaces obeys Gaussian distribution. All of the surfaces have the same correlation length. With the increase of rms height, the distribution of the scattered intensity is broadened, decreased at its peak value and moved backward. The above phenomena were induced by the combination of the local slope and the reflecting index of local slope. This result provides reference to the research under more complex conditions.
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Research of scattering characteristics of rough dielectric surfaces

    Corresponding author: LU Jian, lujian@mail.njust.edu.cn
  • 1. Department of Information Physics & Engineering, Nanjing University of Science & Technology, Nanjing 210094, China

Abstract: In order to study the generation mechanism of scattering characteristics of dielectric random surfaces, on the basis of Kirchhoff approximation, light intensity scattered from rough dielectric surfaces was calculated by means of Monte-Carlo method. The geometric profile of rough surfaces obeys Gaussian distribution. All of the surfaces have the same correlation length. With the increase of rms height, the distribution of the scattered intensity is broadened, decreased at its peak value and moved backward. The above phenomena were induced by the combination of the local slope and the reflecting index of local slope. This result provides reference to the research under more complex conditions.

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