Research of scattering characteristics of rough dielectric surfaces

JIANG Shu; LAI Jian-cheng; LI Zhen-hua; BIAN Bao-min; LU Jian

doi:10.3969/j.issn.1001-3806.2011.03.024

LASER TECHNOLOGY > 2011 > 35(3): 380-383. > DOI: 10.3969/j.issn.1001-3806.2011.03.024

JIANG Shu, LAI Jian-cheng, LI Zhen-hua, BIAN Bao-min, LU Jian. Research of scattering characteristics of rough dielectric surfaces[J]. LASER TECHNOLOGY, 2011, 35(3): 380-383. DOI: 10.3969/j.issn.1001-3806.2011.03.024

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Research of scattering characteristics of rough dielectric surfaces

Department of Information Physics & Engineering, Nanjing University of Science & Technology, Nanjing 210094, China

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Received Date: July 07, 2010
Revised Date: August 23, 2010
Published Date: May 24, 2011

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Abstract

Abstract

In order to study the generation mechanism of scattering characteristics of dielectric random surfaces, on the basis of Kirchhoff approximation, light intensity scattered from rough dielectric surfaces was calculated by means of Monte-Carlo method. The geometric profile of rough surfaces obeys Gaussian distribution. All of the surfaces have the same correlation length. With the increase of rms height, the distribution of the scattered intensity is broadened, decreased at its peak value and moved backward. The above phenomena were induced by the combination of the local slope and the reflecting index of local slope. This result provides reference to the research under more complex conditions.
- scattering,
- rough surface,
- Kirchhoff approximation,
- Monte-Carlo method,
- dielectric medium

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References

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