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Volume 31 Issue 6
Sep.  2012
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Investigation on fluxless laser jet bumping technology

  • Received Date: 2006-09-04
    Accepted Date: 2007-01-26
  • The effect of the technology parameters(laser current,laser pulse time and N2 pressure) for fluxless laser jet bumping on the bump's peel strength under N2 protecting conditions were investigated;the interfacial microstructure and composition of the intermetallic compound at bump(Sn63Pb37)/pad(Au/Ni/Cu) were analyzed in term of scanning electron microscopy and energy dispersive spectrometer.As the laser pulse time is constant,the peel strength decreases with increasing laser current;as the laser current is constant,the peel strength increases with increasing laser pulse time.In case of obtaining good bump's appearance,larger laser current along with shorter pulse time results in the decrease of bump's peel strength,smaller laser current along with longer pulse time increases bump's peel strength.Under existing test conditions,solder ball(Sn63Pb37) may wet the pad(Au/Ni/Cu) commendably.The continuous AuSn4 intermetallic compound layer is formed at the bump/pad interface and AuSn4 is detected in the solder pump near the interface.
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  • [1]

    KASULKE P,SCHMIDT W,lITERLE L et al.Solder ball bumper SB2-A flexible manufacturing tool for 3-dimensional sensor and microsystem packages[A].Twenty-Third IEEE/CPMT Eletronics Manufacturing Technology Symposium[C].Piscataway,NJ:IEEE,1980.70~75.
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    LEE J H,PARK D,KIM Y S.Characteristics of the Pb-Sn eutecticsolder bump formed via fluxless laser reflow soldering[J].Journal of electronic materials,2000,29(10):1153~1159.
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    LEE J H,LEE Y H,KIM Y S.Fluxless laser reflow bumping of Sn-Pb eutectic solder[J].Scripta Materialia,2000,42(8):789~793.
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    LI M Y,WANG Ch Q,BANG H S et al.Development of a flux-less soldering method by ultrasonic modulated laser[J].Journal of Materials Processing Technology,2005,168(2):303~307.
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    ANTAL F,BAGGERMAN J,SCHWARZBACH D.Solder-jetted eutectic PbSn bumps for flip-chip[J].IEEE Transactions on Componeets and Packaging manufacturing Technologies,1998,21(4):371~381.
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    YANG Y S,KIM H Y,CHUN J H.Spreading and solidification of a molten microdrop in the solder jet bumping process[J].IEEE Transactions on Advanced Packaging,2003,26(1):215~221.
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    HONG S M,KANG Ch S,JUNG J P.Plasma reflow bumping of Sn-3.5 Ag solder for flux-free flip chip package application[J].IEEE Transactions on Advanced Packaging,2004,27(1):90~96.
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    HONG S M,KANG Ch S.Fluxless solder bumping in flip chip package by plasma reftow[A].IEEE/EMAP Symposium on Elecfronit Materials and Packaging[C].Piscataway,NJ:IEEE,2001.139~145.
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    TIAN Y H,WANG Ch Q,GE X Sh et al.Intermetallic compounds formation at interface between PBGA,solder ball and Au/Ni/Cu/BT PCB substrate after laser reflow processes[J].Materials Science and Engineering,2002,B95(3):254~262.
    [10]

    LI X Y,QI X J,ZENG X Y.Establishment and application of temperature field model in laser micro-cladding[J].Laser Technology,2005,29(6):561~564(in Chinese).
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通讯作者: 陈斌, bchen63@163.com
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Investigation on fluxless laser jet bumping technology

  • 1. College of Mechanical Engineering, South China University of Technology, Guangzhou 510640, China

Abstract: The effect of the technology parameters(laser current,laser pulse time and N2 pressure) for fluxless laser jet bumping on the bump's peel strength under N2 protecting conditions were investigated;the interfacial microstructure and composition of the intermetallic compound at bump(Sn63Pb37)/pad(Au/Ni/Cu) were analyzed in term of scanning electron microscopy and energy dispersive spectrometer.As the laser pulse time is constant,the peel strength decreases with increasing laser current;as the laser current is constant,the peel strength increases with increasing laser pulse time.In case of obtaining good bump's appearance,larger laser current along with shorter pulse time results in the decrease of bump's peel strength,smaller laser current along with longer pulse time increases bump's peel strength.Under existing test conditions,solder ball(Sn63Pb37) may wet the pad(Au/Ni/Cu) commendably.The continuous AuSn4 intermetallic compound layer is formed at the bump/pad interface and AuSn4 is detected in the solder pump near the interface.

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