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LUO Guang-jun, LUO Bin, PAN Wei, LU Jing, LI Jian-ping. Research of threshold characteristics of coupled-cavity vertical-cavity surface emitting lasers[J]. LASER TECHNOLOGY, 2007, 31(6): 616-619.
Citation: LUO Guang-jun, LUO Bin, PAN Wei, LU Jing, LI Jian-ping. Research of threshold characteristics of coupled-cavity vertical-cavity surface emitting lasers[J]. LASER TECHNOLOGY, 2007, 31(6): 616-619.
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Research of threshold characteristics of coupled-cavity vertical-cavity surface emitting lasers

  • School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China

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  • Received Date: September 18, 2006
  • Revised Date: December 17, 2006
  • Published Date: December 24, 2007
    Graphical Abstract
    • Abstract
  • In order to study the threshold characteristics of coupled-cavity vertical-cavity surface emitting lasers(CC-VCSELs),the threshold carrier density of CC-VCSELs was calculated based on transfer matrix method.Then the threshold current was discussed with the carrier rate equation based on threshold carrier density.The curve of "Double Threshold" point(1mA,0.75mA) and threshold currents curve was obtained.Numerical calculated shows that the results obtained by transfer matrix and carrier rate equation are better than those obtained by rate equation,and the calculation result agreed with the experiment.
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    • References (10)
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