Measurement of optical gain and optical internal loss in GaN-based laser

JIN Chun-lai; HU Xiao-dong; WANG Qi; ZHANG Zhen-sheng; ZHANG Bei

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LASER TECHNOLOGY > 2005 > 29(3): 284-286.

JIN Chun-lai, HU Xiao-dong, WANG Qi, ZHANG Zhen-sheng, ZHANG Bei. Measurement of optical gain and optical internal loss in GaN-based laser[J]. LASER TECHNOLOGY, 2005, 29(3): 284-286.

Citation:

JIN Chun-lai, HU Xiao-dong, WANG Qi, ZHANG Zhen-sheng, ZHANG Bei. Measurement of optical gain and optical internal loss in GaN-based laser[J]. LASER TECHNOLOGY, 2005, 29(3): 284-286.

Citation:

JIN Chun-lai, HU Xiao-dong, WANG Qi, ZHANG Zhen-sheng, ZHANG Bei. Measurement of optical gain and optical internal loss in GaN-based laser[J]. LASER TECHNOLOGY, 2005, 29(3): 284-286.

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Measurement of optical gain and optical internal loss in GaN-based laser

1.
State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China;
2.
Research Center for Wide Gap Semiconductors, Peking University, Beijing 100871, China

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Received Date: May 07, 2004
Revised Date: May 31, 2004
Published Date: May 24, 2005

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Abstract

To assess the performance of a semiconductor laser,knowledge of gain and loss at a known pumping level is essential.Both the gain and the loss coefficients were obtained through analyzing amplified spontaneous emission (ASE) measured with variable stripe length (VSL) method,and serious gain saturation phenomenon was observed in the process.The results confirm the feasibility of the VSL method in studying the performance of GaNLD samples.Performance of LDs with two different structures in gain and gain saturation were compared through VSL method,and the reason that leads to the differen ce was discussed.
- amplified spontaneous emission,
- variable strip elength method,
- optical loss,
- optical gain,
- gain saturation

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References

[1]	OSTER A,ERBERT G,WENZEL H.Gain spectra measurements by a variable stripe length method with current injection [J].Electron Lett,1997,33(10):864～866.
[2]	THOMSON J D,SUMMERS H D,HULYER P J et al.Determination of single-pass optical gain and internal loss using a multisection device [J].A P L,1999,75(17):2527～2529.
[3]	KIMURA Y,ITO A,MIYACHI M et al.Optical gain and optical internal loss of GaN-based laser diodes measured by variable stripe length method with laser processing [J].Japan J A P,2001,40:L1103～L1106.

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