Development for semiconductor laser accelerating lifetime testing system

KANG Jun-jian; ZHANG Shi-ying; SU Mei-kai; WANG Da-cheng

This paper introduces the theory of laser diode(LD)accelerating lifetime testing and mathematic model of life testing,based on wihich a new type of LDs burn-in & automatic life testing system was developed.It continuously samples the power of LDs which works under automatic current control and under the airproof condition filled with nitrogen at testing temperature,plots power-time curve of LD and deduces the working life of LD.

1. Institute of Opto-electronic, Shijiazhuang University of Economics, Shijiazhuang 050031, China;

2. Department of Communication, Xi'an Engineering College of Armed Police Force, Xi'an 710086, China;

3. Department of Opto-electronic Engineering, Beijing Institute of Technology, Beijing 100081, China;

4. Institute of Waterborne Transportation, Ministry of Communications, Beijing 100088, China

Received Date: 2002-12-02

Accepted Date: 2003-11-16

Available Online: 2004-05-25

Abstract: This paper introduces the theory of laser diode(LD)accelerating lifetime testing and mathematic model of life testing,based on wihich a new type of LDs burn-in & automatic life testing system was developed.It continuously samples the power of LDs which works under automatic current control and under the airproof condition filled with nitrogen at testing temperature,plots power-time curve of LD and deduces the working life of LD.

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Reference (11)

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Development for semiconductor laser accelerating lifetime testing system

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通讯作者: 陈斌, bchen63@163.com

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