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Feng Taizhong, Wu Fuquan, Li Guohua. Optical measurement of the thickness along the quartz crystal axis[J]. LASER TECHNOLOGY, 2003, 27(2): 124-125.
Citation: Feng Taizhong, Wu Fuquan, Li Guohua. Optical measurement of the thickness along the quartz crystal axis[J]. LASER TECHNOLOGY, 2003, 27(2): 124-125.
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Optical measurement of the thickness along the quartz crystal axis

  • Laser Institute, Qufu Normal University, Qufu, 273165

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  • Received Date: December 09, 2001
  • Published Date: March 24, 2003
    Graphical Abstract
    • Abstract
  • In the paper,an accurate optical method to meausure thickness along the quartz optical axis is put forward,with which the measurement accuracy can get up to 0.002mm.
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    • References (2)
  • [1]
    龙槐生,张仲先,谈恒英.光的偏振及其应用.1版,北京:机械工业出版社,1989:260.
    [2]
    李国华.光学.1版,济南:山东教育出版社,1990:428.
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