Advanced Search

ISSN1001-3806 CN51-1125/TN Map

Volume 25 Issue 6
Sep.  2013
Article Contents
Turn off MathJax

Citation:

Research of laser scanning phase edge measurement

  • Received Date: 2000-07-14
    Accepted Date: 2000-10-09
  • The system precision is directly affected by the sample edge measurement precision in laser scanning measuring technology.A new method is proposed to detect the edge through modulating scanning laser beam and picking up the phase reversal of the detection signal as the edge signal.Based on the method,the edge measurement precision can be improved less than one micron.
  • 加载中
  • [1] 陈本智,陈兴语.计量学报,1995;(3):221~225

    [2] 李承志.激光技术,1994;(5):303~305

    [3] 张从周,刘兰昊,李承志.长春光机学院学报,1997;(4):31~35

    [4]

    Fotowicz P,Jablonski R.SPIE,Laser Technology Ⅱ,1987;859:245~248
    [5]

    Reich F R.SPIE Advance in Laser Engineerings,1977;122:22~29
    [6] 邾继贵,叶声华,陶国智.光电工程,1996;(3):59~63

    [7] 房晓勇,任克勤,曹茂盛.激光杂志,1996;(1):25~28

    [8] 郭强,白贵儒.光学仪器,1997;(4~5):93~97

    [9] 林棋榕,谢树森,周川钊 et al.光学精密工程,1997;(2):109~114

    [10] 陈岳林.计量与测试技术,1998;(3):25~28

    [11]

    Mainsah E,WonG C M G,Stout K J.SPIE,Measurement Technoloby and Intelligent Instruments,1993;2101:381~395
    [12]

    Meggitt B T.Optic Technology,1989;21(5):343~344
    [13] 吕海宝,谌廷政,周卫红 et al.激光杂志,1998;(3):14~17

    [14] 梁铨廷.物理光学.北京:机械工业出版社,1980:342~346

  • 加载中
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Article views(3217) PDF downloads(213) Cited by()

Proportional views

Research of laser scanning phase edge measurement

  • 1. Department of Optoelectrical Engineering, HUST, Wuhan, 430074

Abstract: The system precision is directly affected by the sample edge measurement precision in laser scanning measuring technology.A new method is proposed to detect the edge through modulating scanning laser beam and picking up the phase reversal of the detection signal as the edge signal.Based on the method,the edge measurement precision can be improved less than one micron.

Reference (14)

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return