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Volume 25 Issue 2
Sep.  2013
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Citation:
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Study of a binary optical element applied in computered tomography image formation spectrometer

  • 1.

    Department of Physics, Nanjing University, Nanjing, 210093;

  • 2.

    Department of Physics, Nanjing Normal University, Nanjing, 210008

  • Received Date: 1999-10-29
  • In this paper, a binary optical element is described. The element is made with binary optical technology. It can be used as a spectral element in a computered tomography image formation spectrometer. The element scatters a light beam into a 3×3 light spot array. The intensity distribution, diffraction efficiency and the relationship between diffraction efficiency and wavelength are given. The experimental results tally with the theoretical ones.
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  • [1] 周进,高文琦,黄信凡 et al.中国激光,1995;A22(2):123～125
    [2] 顾德门 J W 著.傅里叶光学导论.北京:科学出版社,1976:64～80
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Study of a binary optical element applied in computered tomography image formation spectrometer

  • 1. Department of Physics, Nanjing University, Nanjing, 210093;
  • 2. Department of Physics, Nanjing Normal University, Nanjing, 210008
  • Received Date: 1999-10-29
  • Available Online: 2001-03-25

Abstract: In this paper, a binary optical element is described. The element is made with binary optical technology. It can be used as a spectral element in a computered tomography image formation spectrometer. The element scatters a light beam into a 3×3 light spot array. The intensity distribution, diffraction efficiency and the relationship between diffraction efficiency and wavelength are given. The experimental results tally with the theoretical ones.

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