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Yuan Hui, Zhou Jing, Tan Suqing. Study of a binary optical element applied in computered tomography image formation spectrometer[J]. LASER TECHNOLOGY, 2001, 25(2): 112-115.
Citation: Yuan Hui, Zhou Jing, Tan Suqing. Study of a binary optical element applied in computered tomography image formation spectrometer[J]. LASER TECHNOLOGY, 2001, 25(2): 112-115.
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Study of a binary optical element applied in computered tomography image formation spectrometer

  • 1.

    Department of Physics, Nanjing University, Nanjing, 210093;

  • 2.

    Department of Physics, Nanjing Normal University, Nanjing, 210008

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  • Received Date: October 28, 1999
  • Published Date: March 24, 2001
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    • Abstract
  • In this paper, a binary optical element is described. The element is made with binary optical technology. It can be used as a spectral element in a computered tomography image formation spectrometer. The element scatters a light beam into a 3×3 light spot array. The intensity distribution, diffraction efficiency and the relationship between diffraction efficiency and wavelength are given. The experimental results tally with the theoretical ones.
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    • References (2)
  • [1]
    周进,高文琦,黄信凡 et al.中国激光,1995;A22(2):123～125
    [2]
    顾德门 J W 著.傅里叶光学导论.北京:科学出版社,1976:64～80
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