|
[1]
|
Hill K O, Fujii Y,Johnson D C et al. A P L,1978;32(10):647～649 |
|
[2]
|
Meltz G,Morey W W,Glenn W H. Opt Lett,1989;14(15):823～825 |
|
[3]
|
Askins C G,Tasi T E,Williams G M et al. Opt Lett,1992;17(11):833～835 |
|
[4]
|
Archambault J L,Reekie L,Russell P St J.Electron Lett,1993;29(1):28～29 |
|
[5]
|
Archambault J L,Reekie L,Russell P St J.Electron Lett,1993;29(5):453～455 |
|
[6]
|
Dong L, Archambault J L,Reekie L et al.Electron Lett,1993;29(17):1577～1578 |
|
[7]
|
Askins C G,Putnam M A,Friebele E J.Opt Lett,1994;19(2):147～149 |
|
[8]
|
Kashyap R,Armitage J R,Wyatt R et al.Electron Lett,1990;26(11):730～731 |
|
[9]
|
Fertein E,Legoubin S,Douay M et al. Electron Lett,1991;27(20):1838～1839 |
|
[10]
|
Patrick H,Gilbert S L. Opt Lett,1993;18(18):1484～1486 |
|
[11]
|
Hill K O,Malo B,Vineberg K A et al. Electron Lett,1990;26(16):1270～1272 |
|
[12]
|
Malo B,Hill K O,Bilodeau F et al. Electron Lett, 1993;29(18):1668～1669 |
|
[13]
|
Davis D D,Gaylord T K. Electron Lett,1998;34(3):302～303 |
|
[14]
|
Liu M S Y,Tam H Y,Du W Ch.Proc SPIE,1998;3491:301～305 |
|
[15]
|
Hill K O,Malo B,Bilodeau F et al. A P L,1993;62(10):1035～1037 |
|
[16]
|
Anderson D Z,Mizrahi V,Erdogan T et al. Electron Lett,1993;29(6):566～568 |
|
[17]
|
Martin J,Ouellette F. Elestron Lett,1994;30(10):811～812 |
|
[18]
|
Rourke H N,Baker S R,Byron K C et al. Electron Lett,1994;30(16):1341～1342 |
|
[19]
|
Byron K C,Sugden K,Bricheno T et al. Electron Lett,1993;29(18):1659～1660 |
|
[20]
|
Sugden K,Bennion I,Molony A et al. Electron Lett,1994;30(5):440～442 |
|
[21]
|
Farries C,Sugden K,Reid D C J et al. Electron Lett,1994;30(11):891～892 |
|
[22]
|
Kashyap R,McKee P F,Campbell R J et al. Electron Lett,1994;30(12):996～997 |
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