Wang Zhiheng, Fu Kexiang, Wen Jun, Wang Lei, Yuan Jinghe. Research about antireflection characteristics of subwavelength grating[J]. LASER TECHNOLOGY, 1999, 23(1): 34-37.
Citation:
Wang Zhiheng, Fu Kexiang, Wen Jun, Wang Lei, Yuan Jinghe. Research about antireflection characteristics of subwavelength grating[J]. LASER TECHNOLOGY, 1999, 23(1): 34-37.
Wang Zhiheng, Fu Kexiang, Wen Jun, Wang Lei, Yuan Jinghe. Research about antireflection characteristics of subwavelength grating[J]. LASER TECHNOLOGY, 1999, 23(1): 34-37.
Citation:
Wang Zhiheng, Fu Kexiang, Wen Jun, Wang Lei, Yuan Jinghe. Research about antireflection characteristics of subwavelength grating[J]. LASER TECHNOLOGY, 1999, 23(1): 34-37.
Research about antireflection characteristics of subwavelength grating
In this paper,using numerical solution method of vector diffraction theory,we discuss the dependence of reflectivity upon structural parameters of subwavelength grating,particularly upon substrate thickness.It can be used as the basis for design and fabrication of binary optical element with proper antireflection property.
DownLoad: