Research about antireflection characteristics of subwavelength grating

Wang Zhiheng; Fu Kexiang; Wen Jun; Wang Lei; Yuan Jinghe

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LASER TECHNOLOGY > 1999 > 23(1): 34-37.

Wang Zhiheng, Fu Kexiang, Wen Jun, Wang Lei, Yuan Jinghe. Research about antireflection characteristics of subwavelength grating[J]. LASER TECHNOLOGY, 1999, 23(1): 34-37.

Citation:

Wang Zhiheng, Fu Kexiang, Wen Jun, Wang Lei, Yuan Jinghe. Research about antireflection characteristics of subwavelength grating[J]. LASER TECHNOLOGY, 1999, 23(1): 34-37.

Citation:

Wang Zhiheng, Fu Kexiang, Wen Jun, Wang Lei, Yuan Jinghe. Research about antireflection characteristics of subwavelength grating[J]. LASER TECHNOLOGY, 1999, 23(1): 34-37.

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Research about antireflection characteristics of subwavelength grating

Department of Physics, Sichuan University, Chengdu, 610064

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Received Date: October 23, 1997
Revised Date: January 19, 1998
Published Date: January 24, 1999

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Abstract

In this paper,using numerical solution method of vector diffraction theory,we discuss the dependence of reflectivity upon structural parameters of subwavelength grating,particularly upon substrate thickness.It can be used as the basis for design and fabrication of binary optical element with proper antireflection property.
- subwavelength,
- vector theory,
- antireflection

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References

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