A new optoelectronic detector
- Received Date: 1996-07-01
- Accepted Date: 1996-10-08
- Available Online: 1997-03-25
Abstract: This artical introduces the new optoelectronic instrument for detection.It utilizes the Fourier transform of laser beam to extract defect data from workpiece,and then curries out optical information processing under microcomputer control.Automatic detect and classificatin of precision parts are implemented.The instrument had been accredited.