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Volume 13 Issue 5
Sep.  2013
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Article Navigation >  LASER TECHNOLOGY  > 1989 >  13(5): 52-54

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The measurement of the half-wave retardation voltage in crystals by reflective method

  • 1.

    Fujian Institute of Material Structure, Academia Sinica

  • Received Date: 1989-04-03
  • The effect of the mirror on the polarized light is briefly described. The difficulty that the half-wave dealy voltage in a crystal sheet can not be measured by the single optical-path method in the presence of birefringence phenomenon, which can be solved by using the reflective method.
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  • [1] 姚启钧原著,华东师大光学教材编写组改编,《光学教程》,高等教育出版社,北京,1981年,第34-39页.
    [2] С,Э,福里斯,A.B.季莫列桂著,梁宝洪译;《普通物理学》,第三卷,第一分册,高等教育出版社,北京,1958年,第96~97页.
    [3]

    W.A,ShurclifE, Polarized Light, Harvard University Fress, Cambridge, Massachusets, 1962, P.136.
    [4] 小川智哉著,崔承甲译,《应用晶体物理学》,科学出版社,北京,1985年,第70页.
    [5]

    P.S.Theocaris et al,Matrix Theory of Photoelasticity,Springer-Verlag,Berlin,1979,P.56.
    [6]

    J.O.S.A.,1964,Vol.54,No.12, P.1442.
    [7]

    J.O.S.A., 1950,Vol.40, No.4, P.225.
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The measurement of the half-wave retardation voltage in crystals by reflective method

  • 1. Fujian Institute of Material Structure, Academia Sinica
  • Received Date: 1989-04-03
  • Available Online: 1989-09-25

Abstract: The effect of the mirror on the polarized light is briefly described. The difficulty that the half-wave dealy voltage in a crystal sheet can not be measured by the single optical-path method in the presence of birefringence phenomenon, which can be solved by using the reflective method.

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