Citation: | GUO Chunfu, ZHANG Chuanwei, LI Weiqi, LI Xiaoping, LIU Shiyuan. Ellipsometric characterization of the thickness of gradient dielectric films on PET composite substrates[J]. LASER TECHNOLOGY, 2019, 43(4): 585-590. DOI: 10.7510/jgjs.issn.1001-3806.2019.04.026 |
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