Measurement of nonlinear refractive index of bulk bismuth telluride based on reflection z-scan

FENG Dong; ZENG Xiangui

doi:10.7510/jgjs.issn.1001-3806.2016.03.005

LASER TECHNOLOGY > 2016 > 40(3): 326-330. > DOI: 10.7510/jgjs.issn.1001-3806.2016.03.005

FENG Dong, ZENG Xiangui. Measurement of nonlinear refractive index of bulk bismuth telluride based on reflection z-scan[J]. LASER TECHNOLOGY, 2016, 40(3): 326-330. DOI: 10.7510/jgjs.issn.1001-3806.2016.03.005

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Measurement of nonlinear refractive index of bulk bismuth telluride based on reflection z-scan

FENG Dong,
ZENG Xiangui^,

Key Laboratory for Micro/Nano Optoelectronic Devices, Ministry of Education, School of Physics and Electronics, Hunan University, Changsha 410082, China

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Received Date: March 13, 2015
Revised Date: May 04, 2015
Published Date: May 24, 2016

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Abstract

In order to study nonlinear refractive index of bismuth telluride, a 3-D topological insulator, nonlinear refractive index of 800nm femtosecond pulse laser was measured by reflection z-scan method. After theoretical calculation and experimental data fitting, nonlinear refractive index of bismuth telluride crystal could reach the order of magnitude of 10-14m2/W, 105 times of that of quartz. Nonlinear refractive index decreased with the increase of incident power. Until peak intensity reached 85GW/cm2, nonlinear refractive index tended to be a constant. The results show that bismuth telluride is a remarkable nonlinear optical material which has huge potential in the application of all-optical signal processing and optical switching.
- nonlinear optics,
- nonlinear refractive index,
- reflection z-scan,
- bismuth telluride

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