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LIAO Hai, SUN Nian-chun, FENG Guo-ying, ZHOU Chuan-ming. Experimental study on 532nm laser-induced failure of array and linear CCD[J]. LASER TECHNOLOGY, 2010, 34(5): 643-646. DOI: 10.3969/j.issn.1001-3806.2010.O5.018
Citation: LIAO Hai, SUN Nian-chun, FENG Guo-ying, ZHOU Chuan-ming. Experimental study on 532nm laser-induced failure of array and linear CCD[J]. LASER TECHNOLOGY, 2010, 34(5): 643-646. DOI: 10.3969/j.issn.1001-3806.2010.O5.018

Experimental study on 532nm laser-induced failure of array and linear CCD

  • The mechanism of damage on the linear CCD and array CCD was analyzed. Under the irradiation of 532nm laser, the crosstalk threshold, all-pixel crosstalk threshold and totally damaged threshold of both the types of CCDs were measured. Experimental results show that the crosstalk threshold and permanent damage threshold of array CCD are higher than those of linear CCD,while the all-pixel crosstalk threshold of array CCD is lower.This reflects the linear CCD is more resistant to laser interference and sabotage due to its one-dimension structure, while the array CCD is better at resisting the spread of crosstalk between pixels.
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