Citation: | BAI Fan, DAI Yu-tang, XU Gang, CUI Jian-lei. Micromachining technology of sapphire substrate based on 157nm DUV laser[J]. LASER TECHNOLOGY, 2010, 34(5): 636-639. DOI: 10.3969/j.issn.1001-3806.2010.O5.016 |
[1] |
ZHANG K C,ZHANG L.Science and technique of crystal growing[M].Beijing:Science Press,2003:370(in Chinese).
|
[2] |
HSU Y P,CHANG S J,SU Y K,et al.ICP etching of sapphire substrates[J].Optical Materials,2005,27(6):1171-1174.
|
[3] |
JUODKAZIS S,NISHIMURA K,MISAWAW H,et al.In-bulk and surfaces structuring of sapphire by femtosecond pulses[J].Applied Surface Science,2007,253(15):6539-6544.
|
[4] |
DAI Y T,XU G,LI W L,et al.Laser micromachining of wide band-gap materials[J].Advanced Materials Research,2009,69/70:118-122.
|
[5] |
GU E,JEON C W,CHOI H W,et al.Micromachining and dicing of sapphire,gallium nitride and micro LED devices with UV copper vapour laser[J].Thin Solid Films,2004,453/454:462-466.
|
[6] |
ZUO T C.Advanted produce-laser technique and engineering[M].Beijing:Science Press,2007:370-371(in Chinese).
|
[7] |
HERMAN P R,BECKLEY K,POTYRAILO R A.VUV hologra-phic gratings etched by a single F2 laser pulse[C]//Conference on Lasers and Electro-Optics.Anaheim,CA:Optical Society of America,1994:CFI2.
|
[8] |
UTEZA O,BUSSIERE B,CANOVA F,et al.Laser-induced damage threshold of sapphire in nanosecond,picosecond and femtosecond regimes[J].Applied Surface Science,2007,254(4):799-803.
|
[9] |
KIM K,BENTE E.Femtosecond laser micromaching of sapphire[C]//Laser and Electro-Optics Society,2001.The 14th Annual Meeting of the IEEE.San Diego,CA:IEEE,2001:762-763.
|
[10] |
HORISAWA H,EMURA H,YASUNAGA N,et al.Surface machining characteristics of sapphire with fifth harmonic YAG laser pulses[J].Vacuum,2004,73(3/4):661-666.
|
[11] |
DYER P E,JAEKSON S R,KEY P H,et al.Excimer laser ablation and film deposition of Ti:sapphire[J].Applied Surface Science,1996,96/98:849-854.
|
[12] |
DENG H Y,RAO Y J,RAND Z L,et al.Photonic crystal fiber based Fabry-Pérot sensor fabricated by using 157nm laser micromachining[J].Acta Optica Sinica,2008,28(2):255-258(in Chinese).
|