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负热淬灭对富受主型ZnO微米管光电性能的研究

Effect of negative thermal quenching on optoelectronic properties of acceptor-rich ZnO microtubes

  • 摘要: 为了研究ZnO本征缺陷种类与浓度对激子跃迁复合和载流子输运特性的影响,采用改进的光学气化过饱和析出法制备了本征富受主型ZnO(A-ZnO)微米管。通过氧气生长气氛实现了施主-受主对和中性受主束缚激子A0X的浓度调控,揭示了缺陷浓度调控中间态能级产生负热淬灭效应的机制。结果表明,通过提高浅受主缺陷浓度以及提升中间态能级位置,可将A-ZnO微米管的电阻率下降7倍,紫外光响应时间缩短51%,实现了A-ZnO微米管的导电性增强和高效紫外探测。此研究结果为ZnO微纳结构半导体光电器件性能调控提供了新思路。

     

    Abstract: The effect of intrinsic defect types and concentrations on the behaviors of exciton transitions and carrier transports in ZnO was investigated. The intrinsic acceptor-rich ZnO (A-ZnO) microtubes were grown by the developed optical vapor supersaturation precipitation. The oxygen growth carries gas (O2) was used to realize the regulation of donor acceptor pair and neutral acceptor bound exciton A0X concentrations. The negative thermal quenching phenomenon was attributed to the middle energy state dominated by the defect concentrations. The abundant shallow acceptor concentrations and the middle energy state shifting up result in the electrical resistivity reduction by 7 times and the response time decreasing by 51% compared with the A-ZnO microtubes grown in air, leading to the high-efficient ultraviolet detector with high electrical resistivity. The present work provides a novel platform to optimize ZnO-micro/nanostructures-based optoelectronic devices.

     

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