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DWDM窄带滤光片膜层的误差分析与监控策略

李晓平, 易新建, 史铁林

李晓平, 易新建, 史铁林. DWDM窄带滤光片膜层的误差分析与监控策略[J]. 激光技术, 2006, 30(3): 313-316.
引用本文: 李晓平, 易新建, 史铁林. DWDM窄带滤光片膜层的误差分析与监控策略[J]. 激光技术, 2006, 30(3): 313-316.
LI Xiao-ping, YI Xin-jian, SHI Tie-lin. Error analysis and coating thickness control method for the narrow band DWDM filter[J]. LASER TECHNOLOGY, 2006, 30(3): 313-316.
Citation: LI Xiao-ping, YI Xin-jian, SHI Tie-lin. Error analysis and coating thickness control method for the narrow band DWDM filter[J]. LASER TECHNOLOGY, 2006, 30(3): 313-316.

DWDM窄带滤光片膜层的误差分析与监控策略

基金项目: 

国家“八六三”计划资助项目(2004AA404043)

详细信息
    作者简介:

    李晓平(1962- ),男,博士研究生,现从事薄膜技术方面的研究工作.

    通讯作者:

    易新建,E-mail:lyi_jan_ken@tyahoo.com

  • 中图分类号: O484.4+1

Error analysis and coating thickness control method for the narrow band DWDM filter

  • 摘要: 为了提高密集波分复用(DWDM)薄膜窄带滤光片制备的成品率,讨论了用于DWDM薄膜窄带滤光片在镀制过程中的监控方法及误差,采用Monte Carlo允差分析原理分析用于DWDM窄带滤光片膜层的容差,以便选择更易制备的膜系;计算膜层的Mac leod极值灵敏度,得到所选膜系各个膜层的误差要求;模拟光学监控过程和计算膜层导纳,能够得到膜层制备过程中膜层之间膜厚的补偿关系。实验表明,据此制定的膜厚监控策略,对于DWDM窄带滤光片膜层的制备和保证成品率是非常关键的。
    Abstract: To improve the productivity of fabrication of the narrow band DWDM film filter,the monitoring method and error in coating this film is discussed.Monte Carlo method is used to model the tolerance of the layer for the filter,and the results are used to select the easy coating film system.The film thickness error of each layer is obtained by calculating the Macleod maximum sensitivity.The compensation of the film thickness between each layer is obtained by modeling the optical monitoring processes and the film admittance.The strategy of controlling the film thickness is obtained through the above measures,and the experiments have proved that this is crucial to coating the film for the filter and impoving the productivity.
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出版历程
  • 收稿日期:  2005-03-08
  • 修回日期:  2005-11-09
  • 发布日期:  2006-05-24

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