半导体激光器加速寿命测试系统研制
Development for semiconductor laser accelerating lifetime testing system
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摘要: 介绍了半导体激光器(LD)加速寿命测试的理论依据,给出了寿命测试的数学模型,并据此研制了新型LD寿命测试系统。该系统在密封抽真空充氮环境下,通过采集恒功工作LD的工作电流随时间变化的信息及所处环境的温度,绘制出LD的老化曲线,即恒功条件下的“I-t曲线”,然后推断LD的使用寿命。Abstract: This paper introduces the theory of laser diode(LD)accelerating lifetime testing and mathematic model of life testing,based on wihich a new type of LDs burn-in & automatic life testing system was developed.It continuously samples the power of LDs which works under automatic current control and under the airproof condition filled with nitrogen at testing temperature,plots power-time curve of LD and deduces the working life of LD.
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