flaw beam of diffuse reflection laser CCD signal processing
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摘要: 本文系统地介绍了一门新近发展起来的学科---光散射及其应用技术。文中概述了散射理论的发展历史,详细介绍了瑞利散射定律及米氏理论,分析了散射与粒度、表面轮廓形貌统计特性及晶体内部微缺陷之间的数学关系,给出了激光散射在粒度、表面粗糙度测试及微缺陷检测中的应用实例.Abstract: In this paper,a newly developed science subject——light scattering and its application in measurement is introduced.The developmental history is reviewed.Based on Rayleigh scattering theory and Mie theory, the relationship between scattering and particle sizing, statistical characteristics of surface topography and micro defects in crystal are analyzed.At last,some typical application of scattering theory are presented.
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Keywords:
- scattering /
- Rayleigh scattering theory /
- Mie theory /
- measurement /
- application
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[1] 赵凯华,钟锡华光学(下册)北京:北京大学出版社,1984:251~254 [2] Mie G.Annalen der Physik.1908;4(25):377
[3] Van de Hulst H C.Light Scattering by Small Particles.New York:Wil ey,1957:2~5
[4] Kerker M.The Scat tering of Light and Other Elect romagnetic Radiation.New York:Academic,1969:1~3
[5] Bohren C F,Huf fman D R.Absorbtion and Scattering of Light by Small Particles.New York:Wiley,1983:2~6
[6] Davies H.Jof the institution of electrical engineers,1954;101(1):3~4
[7] Sw ithenbank J.Alaser diagnositic technique for the measurement of droplet and particle size distribution.AIAA Paper,1976;(76):69
[8] 玻恩M,沃耳夫E.光学原理(上册)上海:科学出版社,1981:843~863 [9] 张宏建,王乃宁.粉末冶金技术,1990;8(4):234~237 [10] Jacobson R D,Wilson S R.Appl Opt,1992;31(10):1426~1435
[11] Wang H M.Opt&Laser Technol,1994;26(5):333~340
[12] Bennett H E,Porteous J O.J O S A,1961;51(2):123~134
[13] Kienzle O,Staub J,Tschudi T.Measure Science and Technol,1994;(5):747~752
[14] Silva R M.SPIE,1984;511:38~43
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