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266nm纳秒固体激光在CH薄膜上打孔的工艺实验研究

Experimental investigation on 266nm nanosecond solid-state laser drilling on CH film

  • 摘要: 为了研究266nm纳秒固体激光在CH膜上打孔的工艺规律和材料去除机理,采用单因素控制变量的方法,进行了单脉冲和多脉冲打孔的实验研究,分析了266nm纳秒固体激光对CH膜材料的去除机理;取得了激光脉冲能量、脉冲数量对孔径和孔深影响规律的数据。结果表明,单脉冲打孔条件下,当激光脉冲能量为0.014mJ时,微孔直径和深度最小,当激光脉冲能量为0.326mJ时,微孔直径和深度最大,孔径和孔深随着激光脉冲能量的增大而增大;多脉冲打孔条件下,当激光脉冲能量较低时,激光对CH膜的单脉冲烧蚀率约为0.56μm/pulse,当激光脉冲能量较高时,激光对CH膜的单脉冲烧蚀率约为1μm/pulse,孔径和孔深随着激光脉冲数量的增加而增大;266nm纳秒固体激光在CH膜上打孔时的微孔形状规则,大小均匀,微孔周围无残渣、碎屑等抛出物,边缘无热影响区,可推断其材料去除机理主要为“光化学蚀除”。该研究对266nm纳秒固体激光加工CH膜的应用具有一定的参考意义。

     

    Abstract: In order to investigate the process law and material removal mechanism of 266nm nanosecond solid-state laser drilling on CH film, the single-pulse and multi-pulse drilling experiments were carried out by adopting the single-factor control variable method. The removal mechanism of CH film material by 266nm nanosecond solid-state laser was analyzed. The data of the influence of laser pulse energy and pulse number on the diameter and depth of micropores were obtained. The results show that: when the CH film material is drilled by a single pulse with energy of 0.014mJ, the micropore with the smallest diameter and depth is obtained; when the laser pulse energy is 0.326mJ, the micropore with the largest diameter and depth is obtained. Both the diameter and depth of a micropore increases with the increase of laser pulse energy. When the CH film material is drilled by multiple pulses with low pulse energy, the single pulse ablation rate of laser on CH film is about 0.56μm/pulse. When the laser pulse energy is high, the single pulse ablation rate of laser on CH film is about 1μm/pulse. The diameter and depth of a micropore increase with the increase of laser pulse number. When 266nm nanosecond solid-state laser is used as the drilling source on the CH film, the micropores are regular in shape and uniform in size. There are no residues and debris around the micropores, and there is no heat affected zone at the edge. It can be inferred that the material removal mechanism is mainly "photochemical removal". The research has certain reference significance for the application of 266nm nanosecond solid-state laser processing CH film.

     

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