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电子束蒸发制备掺钕钇铝石榴石薄膜特性研究

任豪, 曾群, 庞振华, 周应恒, 梁锡辉

任豪, 曾群, 庞振华, 周应恒, 梁锡辉. 电子束蒸发制备掺钕钇铝石榴石薄膜特性研究[J]. 激光技术, 2012, 36(4): 450-452. DOI: 10.3969/j.issn.1001-806.2012.04.005
引用本文: 任豪, 曾群, 庞振华, 周应恒, 梁锡辉. 电子束蒸发制备掺钕钇铝石榴石薄膜特性研究[J]. 激光技术, 2012, 36(4): 450-452. DOI: 10.3969/j.issn.1001-806.2012.04.005
REN Hao, ZENG Qun, PANG Zhen-hua, ZHOU Ying-heng, LIANG Xi-hui. Characteristics of Nd:Y3Al5O12 thin film prepared by electron beam evaporation deposition[J]. LASER TECHNOLOGY, 2012, 36(4): 450-452. DOI: 10.3969/j.issn.1001-806.2012.04.005
Citation: REN Hao, ZENG Qun, PANG Zhen-hua, ZHOU Ying-heng, LIANG Xi-hui. Characteristics of Nd:Y3Al5O12 thin film prepared by electron beam evaporation deposition[J]. LASER TECHNOLOGY, 2012, 36(4): 450-452. DOI: 10.3969/j.issn.1001-806.2012.04.005

电子束蒸发制备掺钕钇铝石榴石薄膜特性研究

基金项目: 

2009年广州市科学技术局应用基础研究计划资助项目(2009J1-C411)

详细信息
    作者简介:

    任豪(1972- ),男,博士,高级工程师,主要从事硅基发光材料方面的研究.E-mail:r_h@vip.tom.com

  • 中图分类号: O484.4

Characteristics of Nd:Y3Al5O12 thin film prepared by electron beam evaporation deposition

  • 摘要: 硅基光电集成技术是当代高速信息化的重要发展方向之一。为了研究制备在硅衬底上的新型发光材料,突破Nd:YAG固体激光工作物质主要是晶体、透明陶瓷等固体形态的限制,采用电子束蒸发沉积工艺,在硅(100)衬底上制备了Nd:YAG薄膜,并对Nd:YAG薄膜的表面形貌、晶体结构、光学特性进行了测试。X射线和扫描电子显微镜测试结果显示,Nd:YAG薄膜经1100℃真空高温退火处理1h后有效结晶,采用钛蓝宝石激光器输出808nm激光激发,液氮冷却的InGaAs阵列探测器室温下得到Nd:YAG薄膜的1064nm主荧光峰的荧光光谱。结果表明,采用电子束蒸发沉积和后续高温退火工艺可以在硅衬底上制备Nd:YAG晶体薄膜。
    Abstract: Si-based optoelectronic integration technology is one of the main study topics and development directions for the high-speed information.New Si-based luminescent materials were developed to break the limits of Nd:YAG solid laser material,which was confined by two main solid states:single crystal and transparent ceramics.Nd:YAG thin film was prepared on Si(100) substrates by electron beam evaporation deposition.The surface morphology,crystalline phase and optical properties of Nd:YAG thin film were characterized by X-ray diffraction,scanning electron microscopy and spectrophotometer.The crystallization of Nd:YAG thin film was improved after annealing at 1100℃ for 1h in the vacuum,photoluminescent spectra of Nd:YAG thin film were measured at room temperature,with 808nm radiation from a Ti:sapphire laser,and photoluminescent spectrum in the region of 1064nm peak was detected by a liquid nitrogen cooled InGaAs detector array.The results showed that Nd:YAG crystalline thin film was grown on Si substrates for the first time by means of electron beam evaporation deposition and subsequent high temperature annealing process.
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出版历程
  • 收稿日期:  2011-10-23
  • 修回日期:  2011-12-15
  • 发布日期:  2012-07-24

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