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Volume 13 Issue 4
Sep.  2013
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Article Navigation >  LASER TECHNOLOGY  > 1989 >  13(4): 26-32

Citation:
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The measuring precision and analysis error of high-reflectivity—measuring instrument

  • 1.

    Shanghai Institute of Optics and Fine Mechanics, Academia Sinica

  • Received Date: 1988-10-29
  • A description is given of a method of analysis measu ring precision and instrumental error in developing infrared high—reflectivity—measuring instrument.The overall performance achieved and exceeded expectations.
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  • [1]

    H,Kogelnik,Bell Syst.Tech.J.1965,Vol,44,F.455.
    [2]

    D,Kelsall,Appl,.Opt,1970,Vol,9,F.85,
    [3] 10.6微米高反仪研制组,《仪器仪表学报》,1982年,第3卷,第2期,第267页.
    [4] 黄永楷、庄大奎,《光学学报》,1982年,第2卷,第1期,第67页.
    [5]

    F,A,Jenkins,H,E,y}hite,Fundamental of physics of optics,1937.
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  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

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The measuring precision and analysis error of high-reflectivity—measuring instrument

  • 1. Shanghai Institute of Optics and Fine Mechanics, Academia Sinica
  • Received Date: 1988-10-29
  • Available Online: 1989-07-25

Abstract: A description is given of a method of analysis measu ring precision and instrumental error in developing infrared high—reflectivity—measuring instrument.The overall performance achieved and exceeded expectations.

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