Sequential posterior odd test approach in laser warning system test
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Received Date:
2008-08-29
Accepted Date:
2008-12-18
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Abstract
Sequential posterior odd test approach can be used to reduce the size of the test samples and test cost,shorten the test period owing to its adoption of the test data information before test.Taking laser warning test for example,comparing with the traditional test data processing method,the sequential posterior odd test approach needs smaller samples,not only the test target value but also the probability of two kind errors have great influence on test sample size.
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Proportional views
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