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Volume 13 Issue 4
Sep.  2013
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Article Navigation >  LASER TECHNOLOGY  > 1989 >  13(4): 18-20

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Orientation determination methods for frequency doubled devices

  • 1.

    Fujian Institute of Material Structure, Academia Sinica

  • Received Date: 1989-04-03
  • The difficulty in the determination of the orientation in frequency doubled devices by X—ray technique has been solved by using the polarization microscope,Thus,the determination of the orientation of sheet crystals can be satisfactorily settled by the combination of these two methods.
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通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

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Orientation determination methods for frequency doubled devices

  • 1. Fujian Institute of Material Structure, Academia Sinica
  • Received Date: 1989-04-03
  • Available Online: 1989-07-25

Abstract: The difficulty in the determination of the orientation in frequency doubled devices by X—ray technique has been solved by using the polarization microscope,Thus,the determination of the orientation of sheet crystals can be satisfactorily settled by the combination of these two methods.

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