Inspection of circuit defect on LCD panel based on image contour analysis
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Department School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China
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Corresponding author:
YE Yu-tang, ytye@uestc.edu.cn
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Received Date:
2012-07-19
Accepted Date:
2012-08-23
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Abstract
In order to avoid the impact of image registration precision on detection accuracy, a novel approach for circuit defect inspection on liquid crystal displary(LCD)panel was adopted based on image contour analysis. The contours were found by depth first search(DFS), and their areas were calculated according to Green formula. In order to ascertain whether there are any defects such as short, open, hole and island on this LCD, the circuit contours' areas of the LCD to be detected are compared with the areas of standard template. This method needs no image registration, therefore, precision requirement for algorithm is reduced and detection accuracy is improved. Through the experiment on 200 small LCDs, the accuracy comes up to 99%. The results show that all contours are found and their areas are calculated correctly and rapidly. With comparison of areas instead of images, the accuracy of detecting defects such as short and open circuit is improved. This method has great application future in the field of defect detection for LCD circuits.
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