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Volume 35 Issue 2
May  2013
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Effect of annealing temperature on stress and optical properties of hafnium dioxide film

  • Corresponding author: WU Fu-quan, fqwu@mail.qfnu.edu.cn
  • Received Date: 2010-06-18
    Accepted Date: 2010-07-06
  • In order to study the effect of annealing temperature on the stress,optical constants and surface roughness of HfO2 film,the film specimen was fabricated with electron beam evaporation method,then annealed at different temperatures.The film specimen was tested with interferometer,UV-3101PC spectrophotometer,X-ray diffraction instrument and emission scanning electron microscopy.The experimental results show that the HfO2 film is amorphous under the experimental conditions.The residual stress is tensile stress,first decreases and then increases with annealing temperature,and achieve to the minimum at 300℃.The refractive index increases with annealing temperature,however the dispersion decreases with the annealing temperature.The film roughness annealing at low temperature is smaller than that at high temperature.These results can provide reference for the preparation of high-quality HfO2 films.
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  • [1]

    YAN B,WU F Q,HAO D Zh,et al.Temperature features of λ/4 optical thin-film phase retarder[J].Laser Technology,2008,32(2):215-217(in Chinese).
    [2]

    HAO D Zh,WU F Zh,WANG Z B.et al.Development of antireflection thin films based on wollaston prism in hole visible spectrum[J].Journal of Optoelectronics·Laser,2008,19 (8):1143-1144 (in Chinese).
    [3]

    HAO D Zh,WU F Q,KONG W J.The design and test of thin film polarizing beam splitting prism[J].Laser Technology,2004,28(4):401-404(in Chinese).
    [4]

    ZHANG D W,HE H B,SHAO J D,et al.Preparation of high pewer laser film sbased on ion beam assisted deposition[J].Laser Technology,2008,32(1):58-61 (in Chinese).
    [5]

    WANG J,MAIER R L,SCHREIBER H.Crystal phase transition of HfO2 films evaporated by plasma-ion-assisted deposition[J].Applied Optics,2008,47 (13):189-192.
    [6]

    JERMAN M,QIAO Z,MERGEL D.Refractive index of thin films of SiO2,ZrO2,and HfO2 as a function of the films' mass density[J].Applied Optics,2005,44(15):3006-3012.
    [7]

    AL-KUHAILI M F.Optical properties of hafnium oxide thin films and their application in energy-efficient windows[J].Optical Materials,2004,27(3):383-387.
    [8]

    ZHANG L Sh,X U H.Influence of oxygen partial pressure on HfO2 residual stresses and its finite element analysis[J].High Power Laser and Particle Beams,2008,20(6):894-898(in Chinese).
    [9]

    MARTINEZ F,TOLEDANO-LUQUE M,GANDIA J,et al.Optical properties and structure of HfO2 thin films grown by high pressure reactive sputtering[J].Journal of Physics,2007,D40 (17):5256-5265.
    [10]

    HAO D Zh,WANG Q,SANG L K.Influence of oxygen partial pressure on residual stresses of TiO2 films prepared by electron beame vaporation[J].Journal of Optoelectronics·Laser,2009,20 (5):642-644(in Chinese).
    [11]

    LING X L,LI Sh H,ZHOU M,et al.Annealing effect on the laserinduced damage resistance of ZrO2 films in vacuum[J].Applied Optics,2009,48 (29):5459-5463.
    [12]

    YOON S G,KIM YT,KIM H K.Comparision of residual stress and optical properties in Ta2O5 thin films deposited by single and dual ion beam sputtering[J].Materials Science and Engineering,2005,B118(1/3):234-237.
    [13]

    LEE K S,TANG C J,CHEN H C,et al.Measurement of stress in aluminum film coated on a flexible substrate by the shadow moire methed[J].Applied Optics,2008,47(13):C315-C318.
    [14]

    MEZIN A.Coating internal stress measurement through the curvature method:a geometry-based criterion delimiting the relevance of Stoney's formula[J].Surface and Coatings Technology,2006,200(18/19):5259-5267.
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Effect of annealing temperature on stress and optical properties of hafnium dioxide film

    Corresponding author: WU Fu-quan, fqwu@mail.qfnu.edu.cn
  • 1. Shandong Provincial Key Laboratory of Laser Polarization and Information Technology, Institute of Laser Research, Qufu Normal University, Qufu 273165, China

Abstract: In order to study the effect of annealing temperature on the stress,optical constants and surface roughness of HfO2 film,the film specimen was fabricated with electron beam evaporation method,then annealed at different temperatures.The film specimen was tested with interferometer,UV-3101PC spectrophotometer,X-ray diffraction instrument and emission scanning electron microscopy.The experimental results show that the HfO2 film is amorphous under the experimental conditions.The residual stress is tensile stress,first decreases and then increases with annealing temperature,and achieve to the minimum at 300℃.The refractive index increases with annealing temperature,however the dispersion decreases with the annealing temperature.The film roughness annealing at low temperature is smaller than that at high temperature.These results can provide reference for the preparation of high-quality HfO2 films.

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