[1] |
LIU Z J,LU Q Sh,JIANG Zh P,et al.Study on damage effect in CCD detectors irradiated locally by laser[J].Laser Technology,1994,18(6):228-230(in Chinese). |
[2] |
WANG J Q,LUO B Q,FANG Zh Y,et al.Study on laser beam combination by means of isosceles triangle phase grating[J].Laser Technology,2007,31(6):561-564(in Chinese). |
[3] |
NI X W,LU J,HE A Zh.Measurement of laser damaging thresholds of CCD devices[J].Laser Technology,1994,18(3):153-156(in Chinese). |
[4] |
ZHONG H R,LU Q Sh,LU Z J,et al.Review on the laser-induced damage mechanism of CCD detector[J].High Power Laser and Particle Beams,1998,10(4):537-542(in Chinese). |
[5] |
SUN Y Q,CHENG X A,WANG F.Method of quality evaluation aimed at laser-disturbing image[J].Infrared and Laser Engineering,2007,36(5):659-662(in Chinese). |
[6] |
ZHANG Zh,CHEN X A,JIANG Zh F.Excessive saturation effect of visible light CCD[J].High Power Laser and Particle Beams,2008,20(6):917-920(in Chinese). |
[7] |
GUO Sh F,CHENG X A,BO X Q,et al.Failure of array CCD irradiated by high-repetitive femto-second laser[J].High Power Laser and Particle Beams,2007,19(11):1783-1786(in Chinese). |
[8] |
LI F M,NIXON O,NATHAN A.Degradation behavior and damage mechanisms of CCD image sensor with deep-UV laser radiation[J].IEEE Transactions on Electron Devices,2004,51(12):2229-2236. |
[9] |
TIAN Y X.Fourier transformation and its application in Fraunhofor diffraction by circular aperture[J].Journal of Xi'an University of Science and Technology,2005,25(1):106-113(in Chinese). |
[10] |
BORN M,WOLF E.Principles of optics[M].Beijing:Publishing House of Electronics Industry,2006:371-380(in Chinese). |