[1] Takaya Y, Shimizu H, Takahashi S et al. Measurement,1999;25(1):9～18
[2] Atherton P D. Measurement and Control,1998; 31(2):37～42
[3] YoshidaS. Metrologia, 1992; 28(6):433～442
[4] NakayamaK, Tanaka M, Shiota F et al. Metrologia, 1992; 28(6):483～502
[5] Li T Ch. 计量学报,1998; 19(1):9～14
[6] 朱若谷. 光学学报,1994;14(5):508～512
[7] KunzmannH. Metrologia,1992; 28(6):455～462
[8] ChetwyndDG. Measurement and Control, 1998; 31(2):43～47
[9] Parros J M, Weisbord L. Machine Design, 1965; 25:151～156