[1] |
Guenther K H.Smith D J,Liao B.Proc SPIE.1986;678:2 |
[2] |
Macload H A.Microstructure of optical thin film.proc SPIE.1982;325:21 |
[3] |
Pulker H K.Appl Opt.1979:18(12):1969-1977 |
[4] |
Martin P J.Macload H A.Netterfirld R P et al.Appl Opt,1983;22(1):178-184 |
[5] |
McNeil John R,Barron Alan C.Wilson S R et al.Appl Opt,1984;23(4):552-559 |
[6] |
McNeil John R,Hemnann Jr W C.J Vacuum Sci &Technol,1984;(20);324 |
[7] |
KennemoreⅡC M.Gibson U J.Appl Opt,1984;23(22):3608-3611 |
[8] |
Hurley R E.Vacuum,1984.34(3-4):351-355 |
[9] |
Kazuhiro M.Makoto Y.Hidrki T et al.Japan J A P.1991;30(8A):1830-1835 |
[10] |
Ebert J.Proc SPIE.1982;325:29-38 |
[11] |
Ritter E.Opt Acta.1962;9(3):197 |
[12] |
Marl K.Klug W.Zoller A.Mater Sci Eng A:Struct Mater Prop,Microstruct process.1991;A140(7):523-527 |
[13] |
Pfister G.Rows M.L F World.1991;27(9):115-116 |
[14] |
Takehisa S.Rev Sci Instrum,1991;62(12):2890-2894 |