[1] AN Y Y,ZENG X D.Optical detection principle[M].Xi'an:Xidian University Press,2004:56-72(in Chinese).
[2] WANG Y,CHEN J B,ZHUANG S L.Experimental verification of laser Doppler effect[J].Laser Technology,2010,34(2):170-172(in Chinese).
[3] ZHANG X L,TANG W Y.Study on liquid surface wave detection based on laser Doppler effect[J].Laser Technology,2010,34(2):210-213(in Chinese).
[4] BARIK T K,ANUSHREE A,KAR S.A simple experiment on diffraction of light by interfering liquid surface waves[J].America Journal of Physics,2005,73(8):720-730.
[5] SAKAI K,CHOIP K,TANAKA H,et al.A new light scattering technique for a wide-band ripplon spectroscopy at the MHz region[J].Review of Science Instrument,1991,62(5):1190-1193.
[6] ZHONG Zh,TAN J B.Study on fast ultra-precision measurement model in laser heterodyne interferometry[J].Acta Optica Sinica,2005,25(6):791-794 (in Chinese).
[7] DUTTON D,GIVENS M P,HOPKINS R E.Some demonstration experiments in optics using a gas laser[J].American Journal of Physics,1964,32(5):355-361.
[8] HARIHARAN P,WARD B.Interferometry and the Doppler effect an experimental verification[J].Journal of Modern Optics,1997,44(2):221-223.
[9] JOO K N,ELLIS J D,SPRONCK J W,et al.Simple heterodyne laser interferometer with subnanometer periodic errors[J].Optics Letters,2009,34(3):386-388.
[10] CHEN Z F,LU H B,ZHANG Sh Z.A novel wide range nano-resolution ultra-precise diameter measurement instrument[J].Aviation Precision Manufacturing Technology,2001,37(4):32-34(in Chinese).
[11] CHU X Ch.Research on key technology of nanometer displacement measurement by grating[D].Changsha:National University of Defense Technology,2005:12-14(in Chinese).
[12] XU D M,WENG C F,LEI M R.Research on the high accuracy displacement measuring and display system[C] //Chinese Society Modern Technology Equipment 7th International Symposium on Test and Measurement.Beijing:International Academic Publishers,2007:3515-3518(in Chinese).
[13] CHAN H M,YEN K S,RATNAM M M.Crack displacement sensing and measurement in concrete using circular grating Moiré fringes and pattern matching[J].Proceedings of SPIE,2008,7155:715529/1-715529/8.