| [1] | CHEN G,LIAO L J,HAO W.Crystail physics[M].Beijing:Science Press，2007:357-359(in Chinese). |
| [2] | ZHANG S,WU F Q,HAO D Zh,et al.A Spetrometer method for determining thickness of quartz plate along the crystal axis[J].Acta Optica Sinica,2007,27(11):2082-2086(in Chinese). |
| [3] | SU F F,WU F Q.The research of thermal effect on the rotatory powr of quartz[J].Acta Optica Sinica,2005,25(5):670-672(in Chinese). |
| [4] | FENG W W,SONG L K,CHEN L G.The study of the reation between circularly polarrized light's refractive rate and wavelength[J].Laser Technology,2004,28(6):639-640(in Chinese). |
| [5] | CHEN S F,ZHOU F K.The effect of variation of instrument factors on spectral measurement accura cy [J].Journal of Lighting Enginneering,1995,6(3):31-36(in Chinese). |
| [6] | NI Zh B,SONG L K,LIU J P,et al.Measurement of birefringence of a single axis crystal varying with tempe-rature based on double light path[J].Laser Technology,2007,31(4):358-359(in Chinese). |
| [7] | LIAO Y B.Polarized optics[M].Beijing：Science Press，2003:133-135(in Chinese). |
| [8] | LI J Z.Optics manual[M].Xi'an:Science and Technology Press,1986：609,670-671(in Chinese). |