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Volume 11 Issue 5
Sep.  2013
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TEM test of microstructure of optical thin films

  • 1.

    Analysis and Testing Center, Chengdu Branch, Academia Sinica

  • Received Date: 1987-06-10
  • Application of transmission electron microscope technique to microstructurc test of optical thin films and the preparatory technique of TEM specimen are described.
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通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

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TEM test of microstructure of optical thin films

  • 1. Analysis and Testing Center, Chengdu Branch, Academia Sinica
  • Received Date: 1987-06-10
  • Available Online: 1987-09-25

Abstract: Application of transmission electron microscope technique to microstructurc test of optical thin films and the preparatory technique of TEM specimen are described.

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