A phase detection method based on diffraction pattern
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Received Date:
2004-09-27
Accepted Date:
2004-11-05
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Abstract
Based on the principle of the double hemicycle diffraction,by giving each of them different discrepancy,the phase can be detected with the diffraction patterns.The experimental results are compared with the simulation results and both of them is consistent,which shows that the method can efficiently obtain the phase information.Sequentially it gives a simple and effective method for accurate phase detection of the segmented mirrors of a huge combined mirror.
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References
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