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Volume 28 Issue 3
Sep.  2013
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Citation:

Computer simulation and experiment research about optical beam characteristics of semiconductor laser

  • Received Date: 2003-07-07
    Accepted Date: 2003-08-22
  • The goal of this article is to present a measuring system which is fast and simple to be applied for the middle or large scale production of semiconductor lasers.The simulation is performed to the near field pattern,far field pattern and divergence angle etc.of the semiconductor laser with the finite difference analysis.A measuring system is built to measure the characteristics.Finally,the experimental system error is analyzed,and an approach to cut down the error is presented.Compared with other methods,this measuring system is simple,fast and precise.
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  • [1]

    YANG G W,XU J Y,ZHANG I M et al.Theoretical investigation on quantum well lasers with extremely low vertical beam divergence and low threshold current[J].J A P,1998,83(1):8~14.
    [2]

    HUANG M F,LEE H Ch,HO J K et al.Laser diode for DVD pickup head[J].Proc SPIE,1998,3419:110~118.
    [3] 朱晓鹏.光波导数值模拟与半导体激光光束性质研究[D].北京:中国科学院半导体研究所,2002.3~10.

    [4] 吕章德,周国泉,王绍民.AlGaInP/GaInP SCH S-SQW激光器光束质量的矢量矩分析[J].光电子·激光,2001,12(6):549~551.

    [5]

    BIERWIRTH K,SCHULZ N,ARNDT F.Finite-difference analysis of rectangular dielectric waveguide structures[J].IEEE Trans Microwave Theory Technol,1986,34(11):1104~1114.
    [6]

    KIM C M,RAMASWAMY R V.Modeling of graded-index channel waveguide using non-uniform finite-difference method[J].IEEE J Lightwave Technol,1989,7(10):1581~1589.
    [7] 陈军,黄鹏.利用CCD准确测量激光远场发散角[J].强激光与粒子束,1997,19(4):552~556.

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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Computer simulation and experiment research about optical beam characteristics of semiconductor laser

  • 1. Department of Material, Fudan University, Shanghai 200433, China;
  • 2. National Engineering Research Center for Optoelectronic Devices, Institute of Semiconductors, the Chinese Academy of Sciences, Beijing 100083, China;
  • 3. Department of Computer Science, Nanjing University, Nanjing 210093, China

Abstract: The goal of this article is to present a measuring system which is fast and simple to be applied for the middle or large scale production of semiconductor lasers.The simulation is performed to the near field pattern,far field pattern and divergence angle etc.of the semiconductor laser with the finite difference analysis.A measuring system is built to measure the characteristics.Finally,the experimental system error is analyzed,and an approach to cut down the error is presented.Compared with other methods,this measuring system is simple,fast and precise.

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