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Volume 20 Issue 6
Sep.  2013
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Citation:

flaw beam of diffuse reflection laser CCD signal processing

  • Received Date: 1995-07-05
    Accepted Date: 1995-09-22
  • In this paper,a newly developed science subject——light scattering and its application in measurement is introduced.The developmental history is reviewed.Based on Rayleigh scattering theory and Mie theory, the relationship between scattering and particle sizing, statistical characteristics of surface topography and micro defects in crystal are analyzed.At last,some typical application of scattering theory are presented.
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  • [1] 赵凯华,钟锡华光学(下册)北京:北京大学出版社,1984:251~254

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    Mie G.Annalen der Physik.1908;4(25):377
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    Van de Hulst H C.Light Scattering by Small Particles.New York:Wil ey,1957:2~5
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    Kerker M.The Scat tering of Light and Other Elect romagnetic Radiation.New York:Academic,1969:1~3
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    Bohren C F,Huf fman D R.Absorbtion and Scattering of Light by Small Particles.New York:Wiley,1983:2~6
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    Sw ithenbank J.Alaser diagnositic technique for the measurement of droplet and particle size distribution.AIAA Paper,1976;(76):69
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    [9] 张宏建,王乃宁.粉末冶金技术,1990;8(4):234~237

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    Jacobson R D,Wilson S R.Appl Opt,1992;31(10):1426~1435
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    Silva R M.SPIE,1984;511:38~43
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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flaw beam of diffuse reflection laser CCD signal processing

  • 1. Department of Precision Instruments, Tsinghua University

Abstract: In this paper,a newly developed science subject——light scattering and its application in measurement is introduced.The developmental history is reviewed.Based on Rayleigh scattering theory and Mie theory, the relationship between scattering and particle sizing, statistical characteristics of surface topography and micro defects in crystal are analyzed.At last,some typical application of scattering theory are presented.

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