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Volume 16 Issue 5
Sep.  2013
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Article Navigation >  LASER TECHNOLOGY  > 1992 >  16(5): 274-277

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Microstructure and the scattering properties of solid-phase mixed thin films

  • 1.

    Southwest Institute of Technical Physics

  • Received Date: 1992-05-05
  • The solid-phase mixed(SPM) thin films with proper composition show the properties of reduction of optical scattering and improvement of microstructure.The effect is examined with transmission electron microscope(TME),X-ray diffraction analysis and angular scattering measurements.
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  • [1]

    Guenther K H, Pulker H K.Appl Opt, 1976;15: 2992
    [2]

    Dicks A G, Leamy H J, Thin Solid Films, 1977; 47:219
    [3] 孔祥贵,冯铁荪.激光技术,1989; 13(1): 31
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通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

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Microstructure and the scattering properties of solid-phase mixed thin films

  • 1. Southwest Institute of Technical Physics
  • Received Date: 1992-05-05
  • Available Online: 1992-09-25

Abstract: The solid-phase mixed(SPM) thin films with proper composition show the properties of reduction of optical scattering and improvement of microstructure.The effect is examined with transmission electron microscope(TME),X-ray diffraction analysis and angular scattering measurements.

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