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Volume 40 Issue 3
Mar.  2016
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Measurement of nonlinear refractive index of bulk bismuth telluride based on reflection z-scan

  • Corresponding author: ZENG Xiangui, 408236432@qq.com
  • Received Date: 2015-03-14
    Accepted Date: 2015-05-05
  • In order to study nonlinear refractive index of bismuth telluride, a 3-D topological insulator, nonlinear refractive index of 800nm femtosecond pulse laser was measured by reflection z-scan method. After theoretical calculation and experimental data fitting, nonlinear refractive index of bismuth telluride crystal could reach the order of magnitude of 10-14m2/W, 105 times of that of quartz. Nonlinear refractive index decreased with the increase of incident power. Until peak intensity reached 85GW/cm2, nonlinear refractive index tended to be a constant. The results show that bismuth telluride is a remarkable nonlinear optical material which has huge potential in the application of all-optical signal processing and optical switching.
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Measurement of nonlinear refractive index of bulk bismuth telluride based on reflection z-scan

    Corresponding author: ZENG Xiangui, 408236432@qq.com
  • 1. Key Laboratory for Micro/Nano Optoelectronic Devices, Ministry of Education, School of Physics and Electronics, Hunan University, Changsha 410082, China

Abstract: In order to study nonlinear refractive index of bismuth telluride, a 3-D topological insulator, nonlinear refractive index of 800nm femtosecond pulse laser was measured by reflection z-scan method. After theoretical calculation and experimental data fitting, nonlinear refractive index of bismuth telluride crystal could reach the order of magnitude of 10-14m2/W, 105 times of that of quartz. Nonlinear refractive index decreased with the increase of incident power. Until peak intensity reached 85GW/cm2, nonlinear refractive index tended to be a constant. The results show that bismuth telluride is a remarkable nonlinear optical material which has huge potential in the application of all-optical signal processing and optical switching.

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