Progress of Offner imaging spectrometers for eliminating aberration

HAN Shan; HUANG Yuanshen; LI Baicheng; ZHANG Dawei; NI Zhengji

doi:10.7510/jgjs.issn.1001-3806.2015.01.007

Research background and optical structure of an Offner imaging spectrometer were introduced. Aberration of the Offner imaging spectrometer was analyzed by analytical point row graph theory, single grating aberration theory and light path function analysis method respectively. Two special structures (surface inner structure and orthogonal structure) were put forward, which can allow imaging spectrometer with better image quality. It is the research trend to improve the image quality of an imaging spectrometer in the future.

Progress of Offner imaging spectrometers for eliminating aberration

Corresponding author: HUANG Yuanshen, hyshyq@sina.com;

1. Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China

Received Date: 2013-12-04

Accepted Date: 2013-12-16

Available Online: 2015-01-25

Abstract: Research background and optical structure of an Offner imaging spectrometer were introduced. Aberration of the Offner imaging spectrometer was analyzed by analytical point row graph theory, single grating aberration theory and light path function analysis method respectively. Two special structures (surface inner structure and orthogonal structure) were put forward, which can allow imaging spectrometer with better image quality. It is the research trend to improve the image quality of an imaging spectrometer in the future.

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Reference (25)

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Progress of Offner imaging spectrometers for eliminating aberration

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