Experimental study on disturbing effect of pulsed laser against array CCD imaging systems
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1.
Military Representative Office in Chengdu, Fourth Department of the Headquarters of the General Staff, Chinese People's Liberation Army, Chengdu 610036, China;
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2.
Southwest Institute of Technical Physics, Chengdu 610041, China
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Received Date:
2013-10-15
Accepted Date:
2013-10-25
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Abstract
In order to study the disturbing effect of pulsed laser against an array CCD, experiment of CCD imaging system disturbed by repeated pulse laser was carried out at short-distance. Crosstalk effect of the CCD was observed and recorded at an energy density of 2.97mJ/cm2 received by the CCD detector. When the electric shutter of the CCD vidicon was turned on, the images of excursion laser spots were found in the vertical direction of the laser radiation windows except for laser beam spot image. Operation principle of the electric shutter and the transfer mechanism of the CCD were analyzed. Phenomena of laser spot excursion were explained. Experimental results indicate that CCD images can be disturbed by the spot excursion caused by repeated pulse laser. The result lays the academic foundation and elementary experiment for CCD disturbed by repeated pulsed laser.
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References
|
[1]
|
NI X W, LU J, HE A Zh. Measurement of laser damaging thresholds of CCD devices[J]. Laser Techology, 1994, 18(3):153-165(in Chinese). |
|
[2]
|
MA L Y, YU L, LIU J R, et al. Contrastive experimental research of soft-damage on CCD irradiated by XeF laser and YAG frequency-doubled laser[J].Laser Technology, 2010, 34(4): 510-513(in Chinese). |
|
[3]
|
LIU C A, CHEN J B, MA J L, et al. Jamming of visible light array CCD imaging system by infrared laser[J]. High Power Laser and Particle Beams, 2010, 22(8):1728-1730(in Chinese). |
|
[4]
|
WANG B, LI T, LV B D. Active jamming of an infrared seeker with amplitude modulation reticle[J]. Laser Techology, 2006, 30(6):618-620(in Chinese). |
|
[5]
|
ZHU Z W, ZHANG Z, CHENG X A, et al. Damage phenomenon and probability of CCD detectors under single-laser pulse irradiation[J]. Infrared and Laser Engineering, 2013, 42(1):113-118(in Chinese). |
|
[6]
|
KRUER M, ALLEN R, ESTEROWITZ L, et al. Laser damage in silicon photodiodes[J].Optical and Quantum Electronics,1976, 8(5):453-458. |
|
[7]
|
LI W Y , WANG J B , CHENG X A, et al . New analysis on laser-induced damage mechanism of array CCD device [J]. High Power Laser and Particle Beams, 2005, 17(10): 1457-1460(in Chinese). |
|
[8]
|
LIU Z J, LU Q S, JIANG Z P. Study of damage effect in CCD detectors irradiated locally by laser[J]. Laser Technology, 1994, 18(6):344-347(in Chinese). |
|
[9]
|
LIAO H, SUN N C, FENG G Y, et al. Experimental study on 532nm laser-induced failure of array and linear CCD[J]. Laser Technology, 2010, 34(5):643-646(in Chinese). |
|
[10]
|
ZHANG Z, CHENG X A, JIANG Z F, et al. Experimental study on saturation effect of visible light CCD induced by 1064nm laser[J]. Chinese Journal of Lasers, 2010, 37(s1):131-135(in Chinese). |
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