Study on measurement method of carrier mobility in weak photoconductive material
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1.
Laboratory of Electro-Optical Information Control and Security Technology, Sanhe 065201, China;
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2.
Specific Support Equipment Military Representative Office of Second Artillery Stationed in Jinzhou Region, Jinzhou 121000, China
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Received Date:
2013-07-29
Accepted Date:
2013-09-28
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Abstract
In order to measure the carrier mobility of weak conductive material accurately, the charge carrier mobility of Alq3 was measured with the method of time of flight (TOF). The experimental conditions of TOF were analyzed theoretically and verified experimentally. The effects of the wavelength of the excitation light source, the single pulse energy and the selection of integration time constant of circuit measurement on the material carrier mobility measurement results were discussed. The results show that TOF is a typical optical measurement method. But it is possible to obtain accurate and reliable test results when measuring the carrier mobility of weak conductive material by means of TOF only if selecting appropriate measurement conditions strictly. This conclusion is helpful for the accurate measurement of carrier mobility of organic electroluminescent device.
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Proportional views
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