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Volume 33 Issue 6
May  2010
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Citation:

Sequential posterior odd test approach in laser warning system test

  • Received Date: 2008-08-29
    Accepted Date: 2008-12-18
  • Sequential posterior odd test approach can be used to reduce the size of the test samples and test cost,shorten the test period owing to its adoption of the test data information before test.Taking laser warning test for example,comparing with the traditional test data processing method,the sequential posterior odd test approach needs smaller samples,not only the test target value but also the probability of two kind errors have great influence on test sample size.
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  • [1]

    TANG X M,ZHANG J H.Test analysis and evaluation of weapon system in small-sample circumstances[M].Beijing:National Defense Industry Press,2001:68-77(in Chinese).
    [2]

    ZHAO L,LI J Y.Research on small example maintainability experimentation and evaluation of bayes-based theory[J].Ship Electronic Engineering,2006,26(1):113-117(in Chinese).
    [3]

    KANG L,DONG Sh G,GUO N L.Armament test evaluation and load calculation based on bayesian assessment[J].Journal of Air Force Engineering University(Natural Science Edition),2003,4(6):30-33(in Chinese).
    [4]

    WANG L D,SHEN X J,WANG G Y.Evaluation method for radar equipment test in small-subsample circumstances[J].Systems Engineering and Electronics,2003,25(5):523-525(in Chinese).
    [5]

    TANG X M,ZHOU B Zh,LI R.Integrated test design and evaluation technology of weapon system in small sample situation[J].Tactical Missile Technology March,2007(2):51-56(in Chinese).
    [6]

    LI Zh Sh,LI J Sh,ZHANG J T,et al.The application of bayes fusion method in weapon small-sample test circumstances[J].Command Control Simulation,2006,28(3):64-67(in Chinese).
    [7]

    YANG Z F,QIAN H W,GAO G H.Development of laser warningtechnology[J].Laser Technology,2004,28(1):28-32(in Chinese).
    [8]

    GE Q Sh,GONG Ch K.Reconnaissance performance analysis for vehicular laser warning device[J].Laser Infrared,2003,32(3):4-7(in Chinese).
    [9]

    WANG G Y,SHEN X J,WANG L D,et al.Small-sample test theory and technique of electronic system[M].Beijing:National Defense Industry Press,2003:144-148(in Chinese).
    [10]

    CHEN X L,CHEN J,JIANG P Ch,et al.Radar test[M].Beijing:National Defense Industry Press,2004:182(in Chinese).
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Sequential posterior odd test approach in laser warning system test

  • 1. 63891 Unit of People's Liberation Army, Luoyang 471003, China

Abstract: Sequential posterior odd test approach can be used to reduce the size of the test samples and test cost,shorten the test period owing to its adoption of the test data information before test.Taking laser warning test for example,comparing with the traditional test data processing method,the sequential posterior odd test approach needs smaller samples,not only the test target value but also the probability of two kind errors have great influence on test sample size.

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