Effect of thickness of defect layer on dual defect modes of 1-D photonic crystal
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College of Physics and Engineering, Qufu Normal University, Qufu 273165, China;
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2.
Department of Physics, Jining University, Qufu 273155, China
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Corresponding author:
WANG Ji-ke, yankezhu@126.com
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Received Date:
2008-05-05
Accepted Date:
2008-07-04
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Abstract
With the eigen matrix method,it analysed the relation between dual defect modes and the thickness of the defect layer in 1-D photonic crystal was analyzed. The results showed that when the thickness of the defect layer was changed totally,the position of dual defect modes at low frequencies was different from that at high frequencies. When the thickness of the material with positive refractive index was solely increased,the position of dual defect layers was red-shifted. On the contrary,the position was blue-shifted when the thickness of the material with positive reflective index was solely increased. The transmissivity of dual defect modes changed intricately. The property can be used to design some specific photonic devices.
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