[1] LIU G H. Research on the TV tracking system technology[D]. Nanjing: Nanjing University of Science and Technology, 2013: 1-2(in Chinese).
[2] ZHANG L P. The hardware design and realization of TV tracking[D]. Wuhan: Wuhan University of Science and Technology, 2008: 1-2(in Chinese).
[3] BI J, ZHANG X H, NI X W. Mechanism for long pulse laser-induced hard damage to the MOS pixel of CCD image sensor[J]. Acta Physica Sinica, 2011, 60(11):114210(in Chinese).
[4] ZHANG D Y, ZHAO J H, WANG W P, et al. Study of disturance to visible-light array CCD detectors irradiated by 1.319μm CW YAG laser[J].High Power Laser and Particle Beams, 2003, 15(11):1050-1052(in Chinese).
[5] GUO Sh F, CHENG X A, FU X Q, et al.Failure of array CCD irradiated by high-repetitive femto-second laser[J]. High Power Laser and Particle Beams, 2007, 19(11):1783-1786(in Chinese).
[6] CHENG X A, LU Q Sh, MA L Q, et al. Experimental study of HgCdTe(PV) detector irradiated by CW 1.319μm laser[J]. Acta Optica Sinica, 2003, 23(5):622-626(in Chinese).
[7] ZHANG Ch, WANG B, LIAO Zh Y, et al.Experimental study on disturbing effect of pulsedlaser against array CCD imaging systems[J].Laser Technology, 2014, 38(5):619-622(in Chinese).
[8] NI X W, LU J, HE A Zh. Study of hard-destructive mechanism of the charge-coupled devices by a laser[J].Acta Physica Sinica, 1994, 43(11):1795-1802(in Chinese).
[9] QIU D D, ZHANG Zh, WANG R, et al. Mechanism research of pulsed-laser induced damage to CCD imaging devices[J].Acta Optica Sinica, 2011, 31(2):0214006(in Chinese). doi: 10.3788/AOS
[10] SINGH A P, KAPOOR A, TRIPATHI K N, et al. Laser damage studies of silicon surfaces using ultra-short laser pulses[J]. Optics & Laser Technology, 2002, 34(1):37-43.
[11] LIU X, DU D, MOUROU G. Laser ablation and micromachining with ultrashort laser pulses[J]. IEEE Journal of Quantum Electronics, 1997, 33(10):1706-1716. doi: 10.1109/3.631270
[12] NIE J S, WANG X, LI H, et al. Thermal and mechanical damage in CCD detector induced by 1.06μm laser[J].Infrared and Laser Engineering, 2013, 42(s2):380-386(in Chinese).
[13] YONEMOTO K. CCD/CMOS image sensor no Kiso to Ouyou[M].Beijing:Science Press, 2006:65-76(in Chinese).
[14] LU J, NI X W, HE A Zh.Physics of interaction between laser and materials[M]. Beijing:Machinery Industry Press, 1996: 32-34(in Chinese).
[15] SUN Ch W. Laser irradiation effect[M].Beijing:National Defend Industry Press, 2002:28-32(in Chinese).
[16] LIN B P, TANG J N, LIU H J, et al.Structure and infrared emissivity of polyimide/mesoporoussilica composite films[J].Journal of Solid State Chemistry, 2005, 178(3):650-654. doi: 10.1016/j.jssc.2004.12.010
[17] SHAO C M, LUO Y, XU G Y, et al.Preparation and infrared emissivity properties of core-shell structured SiO2@ Bi2O3 spheres[J].Materials Science & Technology, 2010, 18(1): 43-45(in Chinese).
[18] WANG X L.Preparation and properties of PI/SiO2-Al2O3 nanocomposite films[D].Harbin: Harbin University of Science and Technology, 2009: 4-5(in Chinese).