[1] VILLA J, GÓMEZ-PEDERO J A, QUIROGA J A. Sinusoidal leastsquares fitting for temporal fringe pattern analysis [J]. J Modern Opt,2002,49 (13):2257～2266.
[2] GROOT P D. Phase-shift calibration errors in interferometers with spherical Fizeau cavities [J]. Appl Opt, 1995,34 (16):2856～2863.
[3] JÓŸWICKI R, KUJAWINSKA M,SABUT L. New contra old wavefront measurement concepts for interferometric optical testing [J]. Opt Engng,1992,31 (3):422～433.
[4] TAKEDA M. Spatial carrier heterodyne techniques for precision interferometry and profilometry: an overview [J]. SPIE, 1989,1121: 73～88.
[5] SIRKIS J S,CHEN Y M,SINGH H et al. Computerized optical fringe pattern analysis in photomechanics: a review [J]. Opt Engng, 1992,31(2):304～314.
[6] TOYOOKA S,TOMINAGA M. Spatial fringe scanning for optical phase measurement [J]. Opt Commun, 1984,51 (2):68～70.
[7] TOYOOKA S, IWAASA Y. Automatic profilometry of 3-D diffuse objects by spatial phase detection [J]. Appl Opt, 1986,25 (10): 1630～1633.
[8] RANSOM P L, KOKAL J V. Interferogram analysis by a modified sinusoid fitting technique [J]. Appl Opt,1986,25(22):4199～4204.
[9] WOMACK K H. Interferometric phase measurement using spatial synchronous detection [J]. Opt Engng,1984,23(4):391～395.
[10] TANG S, HUNG Y. Fast profilometer for the automatic measurement of 3-D object shapes [J]. Appl Opt,1990,29(20):3012～3018.
[11] 周绍祥,高瞻,胡玉禧.光载波条纹图的计算机辅助分析——阶梯形虚拟光栅解调法[J].光子学报,1998,27(3):228～233.
[12] TAKEDA M, INA H, KOBAYASHI S. Fouier-transform method of fringe-pattern analysis for computer-based topography and interferometry [J].J O S A,1982,72(1):156～160.
[13] 姚卫,李振华,贺安之.用伽伯小波作干涉波前重建[J].光学学报,1999,19(6):805～810.
[14] WATKINS L R,TAN S M, BARNES T H. Determination of interferometer phase distributions by use of wavelets [J]. Opt Lett, 1999,24(13):905～907.
[15] 顾杰,陈方.光载波条纹自动化图像处理[J].中国激光,1994,21(6):499～503.
[16] GU J,CHEN F. Fast Fourier transform,iteration,and least-squares-fit demodulation image processing for analysis of single-carrier fringe pattern [J]. J O S A, 1995,12(10):2159～2164.
[17] FERNANDEZ A,KAUFMANN G H, BLANCO-GARCIA J et al. Fast Fourier transform,iteration, and least-squares-fit demodulation image processing for analysis of single-carrier fringe pattern [J]. Opt Engng, 1998,37 (11):2899～2905.
[18] BONE D J, BACHOR H A, SANDEMAN R J. Fringe-pattern analysis using a 2-D Fourier transform [J]. Appl Opt, 1986,25 (10): 1653～1660.
[19] BRACEWELL R N. Aspects of the Hartley transform [J]. Proc IEEE,1994,82(3):381～386.
[20] NG T W. Speckle photography fringe analysis using the discrete Hartley transform [J]. Opt Commun,1997,136(1):11～15.
[21] MASSIG J H,HEPPNER J. Fringe-pattern analysis with high accuracy by use of the Fourier-transform method: theory and experimental tests [J]. Appl Opt,2001,40(13):2081～2088.
[22] RODDIER C, RODDIER F. Interferogram analysis using Fourier transform techniques [J]. Appl Opt, 1987,26(9):1668～1673.
[23] GE Z, KOBAYASHI F, MATSUDA S et al. Coordinate-transform technique for closed-fringe analysis by the Fourier-transform method [J]. Appl Opt,2001,40(10):1649～1657.
[24] LIU J B, RONNEY P D. Modified Fourier transform method for interferogram fringe pattern analysis [J]. Appl Opt,1997,36(25):6231～6241.